Joel D Berkson - National Science Foundation

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1 Active

SBIR Phase II: Advanced Metrology System for Surface and Bonding Quality Control in Semiconductor Manufacturing
Berkson, J. D. (PI)
SBIR Phase II
09/01/26 → 08/31/28
Project: Research
SBIR Phase I: Rapid and Accurate Large Aperture Surface Metrology for Future High Speed Communication
Berkson, J. D. (PI)
SBIR Phase I
03/15/24 → 05/31/25
Project: Research